Patent · US Expired

Method of electro-optical measurement for vector components of electric fields and an apparatus thereof

US5737082A · kind A · utility

6Cited by
18References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 24, 1995
Grant dateApr 7, 1998
Priority date
Expiry dateJul 24, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J4/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus of measuring an electric signal comprises a laser device, optical elements, an electrooptic crystal, a photoelectric converter, and an electric circuit. The electrooptic crystal is selected from the materials in the type of having properties of changing its refractive index in the direction of its optic major axes and the direction of these axes by a function of an applied electric field. In the apparatus, the electrooptic crystal is placed in the electric field applied by an electric circuit under measurement. A laser beam emitted from the laser device is incident on the electrooptic crystal. A reflected light passed through the crystal is resolved into rays in two polarized direction. Each ray is subjected to a photoelectric conversion by passing through the photoelectric converter and exerted as an electric output. A differential signal of the electric output is defined as a measurement signal. By selecting two polarized directions of the laser beam by a half-wave plate as the optical element, two signals corresponding to the changes in the refractive index and optic major axes of the crystal. Two component of a vector of the electric field can be obtained by a firs…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.