Patent · US Expired

Method of making self-aligned dual gate MOSFET with an ultranarrow channel

US5739057A · kind A · utility

93Cited by
17References
19Claims
0Family size

Inventors

Key dates

Filing dateApr 18, 1996
Grant dateApr 14, 1998
Priority date
Expiry dateApr 18, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/518
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A dual gate field effect transistor with an ultra thin channel of substantially uniform width formed by a self-aligned process utilizing selective etching or controlled oxidation between different materials to form a vertical channel extending between source and drain regions, having a thickness in the range from 2.5 nm to 100 nm.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.