Patent · US Expired

Radiation detector

US5739541A · kind A · utility

29Cited by
6References
15Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 1, 1996
Grant dateApr 14, 1998
Priority date
Expiry dateJul 1, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01T1/26
  • WIPO fieldEnvironmental technology
  • WIPO sectorChemistry

Abstract

A method for detecting ionizing radiation by allowing the radiation to affect the surface of the floating gate of a MOSFET transistor through an air or gas space. For this purpose, an uncovered area is formed on the surface of the floating gate of the MOSFET transistor forming the detector. The MOSFET transistor is used so that a charge is formed on its floating gate, the charge changing as a result of the ionizing radiation the transistor is exposed to. The radiation dose is determined by the change which takes place in the charge on the gate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.