Sampling technique for waveform measuring instruments
US5740064A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 12, 1996 |
| Grant date | Apr 14, 1998 |
| Priority date | — |
| Expiry date | Jan 12, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/345
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A new sampling technique for waveform measuring instruments (including methods and circuits for implementing same) comprises the step of processing a series of digital signal samples through a decimator to extract a decimated sample value from each decimated sample interval in a series of decimated sample intervals. The series of digital signal samples is simultaneously processed through a digital peak detector to extract maximum and minimum values (peak detect sample values) from each decimated sample interval. For a given decimated sample interval, a difference between the maximum and minimum sample values for the interval is calculated. If the difference exceeds a glitch detect threshold value, the maximum and minimum sample values for the given decimated sample interval are transferred to a video sample memory. If not, the decimated sample value for the given decimated sample interval is transferred to the video sample memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.