Method and apparatus for identifying and correcting date calculation errors caused by truncated year values
US5740442A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 27, 1996 |
| Grant date | Apr 14, 1998 |
| Priority date | — |
| Expiry date | Aug 27, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3636
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A standardized test environment assists identifying problematic instances of instructions in computer programs that produce erroneous results caused by dates having years expressed in a truncated form. A standardized production environment takes corrective action for specified instances of instructions by modifying one or more values such that the instructions achieve correct results. In one embodiment of a test environment, a computer system collects diagnostic information for instances of subtraction operations that produce negative results. In one embodiment of a production environment, a computer system intercepts execution of a computer program at specified locations and takes corrective action according to information obtained from a table of control information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.