Method for quantitative analysis of earth samples
US5741707A · kind A · utility
27Cited by
8References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 24, 1994 |
| Grant date | Apr 21, 1998 |
| Priority date | — |
| Expiry date | Jun 24, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/3595
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for analyzing a sample to determine its mineral composition. The invention combines X-ray diffraction with Fourier transform infrared spectroscopy to provide a complete spectrum including molecular vibrations, probed by FTIR scans and lattice spacing measured by X-ray diffraction in a single representation. This FX spectrum provides a more complete and accurate mineralogy than either of the techniques alone. In addition, new techniques for independent X-ray diffraction analysis and FTIR analysis are described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.