Ambiguity resolving algorithm for interferometers of arbitray topologies
US5742252A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 26, 1996 |
| Grant date | Apr 21, 1998 |
| Priority date | — |
| Expiry date | Aug 26, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S3/46
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for reducing the computational requirements for resolving ambiguity in interferometer measurements where the interferometer elements are arranged arbitrarily. Each of a plurality of interferometer elements each measures the phase of the incoming electromagnetic signal. The interferometer elements are each separated by lengths defined as baselines, which are sorted and processed in ascending order. Following initialization, for each baseline (92, 108), the phase measurements of the next baseline (92, 108) to be processed are estimated. If the measured phases (94-100, 110-118) of the next baseline (92, 108) falls within a predetermined range (104, 106) of the estimated phases, the phase is retained for estimating the phases of the next baseline. After a sufficient number of baselines have been processed, the angle of the incoming electromagnetic signal may be determined in accordance with the retained phases.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.