Patent · US Expired

Multi-port random access memory

US5742557A · kind A · utility

51Cited by

4References

4Claims

0Family size

Assignee

Nortel Networks Limited · CA

Inventors

Robert Gibbins · Almonte, CA
Garnet Frederick Randall Gibson · Ottawa, CA
Steven William Wood · Ottawa, CA

Key dates

Filing date	Sep 19, 1996
Grant date	Apr 21, 1998
Priority date	—
Expiry date	Sep 19, 2016

Classification

Technology area (CPC G)Physics
CPC primaryG11C29/50
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Disclosed is an architecture of a RAM (random access memory) with BIST (built-in self test) or functional test function. The RAM has a memory cell for storing differential or single-ended binary data and bit line signals are fully differential or single-ended. Shadow write is applied to read only and read-write bit lines. With the test function, port-to-port bit line shorts and port-to-port word line shorts are sensitized.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.