Controller for implementing scan testing
US5742617A · kind A · utility
17Cited by
11References
12Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 24, 1995 |
| Grant date | Apr 21, 1998 |
| Priority date | — |
| Expiry date | Aug 24, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2273
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test access port controller is provided for implementing scan testing with a chain of scan latches on an integrated circuit. The test access port controller can implement a structural test or a performance test. Selection between the two types of test is achieved through logic circuitry of the test access port controller. An integrated circuit and a test system are also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.