Fixed pattern compensation with adaptive window for MTF testing
US5745609A · kind A · utility
4Cited by
5References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 29, 1997 |
| Grant date | Apr 28, 1998 |
| Priority date | — |
| Expiry date | Jan 29, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20056
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
This invention is an apparatus and method that is able to accurately measure the system level modulation transfer function in the presence of fixed pattern noise from an imaging system electronics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.