Method and apparatus for recognizing a test signal and determining signal transfer characteristics therefrom
US5749047A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 5, 1995 |
| Grant date | May 5, 1998 |
| Priority date | — |
| Expiry date | Apr 5, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R23/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for fast response and distortion measurement of a signal transfer device. A computer processor generates a multitone test signal of predetermined duration and stores it in a memory. The test signal is read out, converted to analog form, if necessary, and applied to the input of a device under test. The output produced by the device under test in response to the test signal is acquired and digitized, if necessary, and a Fast Fourier Transform is performed on the acquired data to determine its spectral characteristics. Frequency response, harmonic distortion, intermodulation distortion, phase distortion, wow and flutter and other signal transfer characteristics are measured by the CPU by analysis of the output signal. In one embodiment, the measurement equipment senses the presence of the test signal by comparing the received spectrum to a pair of templates whose shapes are determined by the test signal spectrum.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.