Raman scattered light measuring apparatus
US5754289A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 27, 1996 |
| Grant date | May 19, 1998 |
| Priority date | — |
| Expiry date | Dec 27, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/065
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A Raman scattered light measuring apparatus comprises a near infrared semiconductor laser diode as a light source for irradiating a sample with excitation light, while a photoreceiving part for receiving Raman scattered light from the sample comprises a bandpass filter having a vibration wavenumber which is specific to a sample component to be measured as a central wavelength of its transmission region, and a detector consisting of a photodiode of Ge, InAs or InGaAs or a photomultiplier having sensitivity in a near infrared region for detecting Raman scattered light which is transmitted through the bandpass filter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.