Patent · US Expired

Raman scattered light measuring apparatus

US5754289A · kind A · utility

30Cited by
6References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 27, 1996
Grant dateMay 19, 1998
Priority date
Expiry dateDec 27, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/065
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A Raman scattered light measuring apparatus comprises a near infrared semiconductor laser diode as a light source for irradiating a sample with excitation light, while a photoreceiving part for receiving Raman scattered light from the sample comprises a bandpass filter having a vibration wavenumber which is specific to a sample component to be measured as a central wavelength of its transmission region, and a detector consisting of a photodiode of Ge, InAs or InGaAs or a photomultiplier having sensitivity in a near infrared region for detecting Raman scattered light which is transmitted through the bandpass filter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.