Method and apparatus for measuring the intensity and phase of an ultrashort light pulse
US5754292A · kind A · utility
Assignees
Inventors
Key dates
| Filing date | Oct 26, 1992 |
| Grant date | May 19, 1998 |
| Priority date | — |
| Expiry date | Oct 26, 2012 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J11/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The pulse shape I(t) and phase evolution x(t) of ultrashort light pulses are obtained using an instantaneously responding nonlinear optical medium to form a signal pulse. A light pulse, such a laser pulse, is split into a gate pulse and a probe pulse, where the gate pulse is delayed relative to the probe pulse. The gate pulse and the probe pulse are combined within an instantaneously responding optical medium to form a signal pulse functionally related to a temporal slice of the gate pulse corresponding to the time delay of the probe pulse. The signal pulse is then input to a wavelength-selective device to output pulse field information comprising intensity vs. frequency for a first value of the time delay. The time delay is varied over a range of values effective to yield an intensity plot of signal intensity vs. wavelength and delay. In one embodiment, the beams are overlapped at an angle so that a selected range of delay times is within the intersection to produce a simultaneous output over the time delays of interest.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.