Optical strain sensor for the measurement of microdeformations of surfaces
US5757473A · kind A · utility
47Cited by
11References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 13, 1996 |
| Grant date | May 26, 1998 |
| Priority date | — |
| Expiry date | Nov 13, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical strain sensor for measuring microdeformations of a surface with a resolution of at least 0.2 microns. The sensor comprises at least one camera for taking photographs of areas of the surface, the photographs being separated by a known fixed distance from one another before deformation has occurred. Templates are selected on the photographs taken before deformation, relocalized on photographs taken after deformation of the surface, and the deformation is derived from the computation of the difference in distances between the templates before and after deformation has occurred.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.