Method and a device for photothermally testing workpieces
US5760400A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 2, 1996 |
| Grant date | Jun 2, 1998 |
| Priority date | — |
| Expiry date | Jul 2, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/085
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for photothermally testing workpieces, which includes the steps of directing an electromagnetic excitation beam to a desired measuring point on the workpiece surface, detecting and evaluating the heat in the form of thermal radiation which is generated by the excitation beam at the measuring point with the aid of a measuring head; directing two visible locating beams to the workpiece surface, the two locating beams intersecting at a point of intersection; and correcting the relative position between the workpiece and the measuring head so that the point of intersection and the desired measuring point coincide on the workpiece surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.