Monolithic wavelength meter and photodetector using a wavelength dependent reflector
US5760419A · kind A · utility
28Cited by
1References
28Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Jul 31, 1996 |
| Grant date | Jun 2, 1998 |
| Priority date | — |
| Expiry date | Jul 31, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A compact and cost-effective wavelength meter and photodetector (10) that can measure simultaneously both wavelength and intensity has two back-to-back photodiodes (12 and 14) with a wavelength dependent distributed Bragg reflector (DBR) (28) positioned in-between. The wavelength resolution of this device is 1 nm or less. Easy design and fabrication of the device provides for reliable and cost-effective manufacturing. Applications include instrumentation and wavelength-division-multiplexing (WDM) in optical communication systems.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.