Patent · US Expired

Expert system for testing industrial processes and determining sensor status

US5761090A · kind A · utility

100Cited by
39References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 10, 1995
Grant dateJun 2, 1998
Priority date
Expiry dateOct 10, 2015

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S706/906
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A method and system for monitoring both an industrial process and a sensor. The method and system include determining a minimum number of sensor pairs needed to test the industrial process as well as the sensor for evaluating the state of operation of both. The technique further includes generating a first and second signal characteristic of an industrial process variable. After obtaining two signals associated with one physical variable, a difference function is obtained by determining the arithmetic difference between the pair of signals over time. A frequency domain transformation is made of the difference function to obtain Fourier modes describing a composite function. A residual function is obtained by subtracting the composite function from the difference function and the residual function (free of nonwhite noise) is analyzed by a statistical probability ratio test.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.