Analytical method using modified scanning probes
US5763768A · kind A · utility
40Cited by
5References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 17, 1997 |
| Grant date | Jun 9, 1998 |
| Priority date | — |
| Expiry date | Mar 17, 2017 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/853
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a method of analyzing for a specific material in a sample using a sensor including a resonating member having resonating properties. The resonating member has a probe and a known material is disposed on or forms the probe. The method includes the steps of positioning the sensor proximate to the sample, detecting a force dependent change in the resonance properties of the sensor, and confirming the presence of the specific material based on the identity of the known material and the detection of a resonance change.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.