Method and system for generating a global hit test data structure using scan line compression of windows in a graphical user interface
US5764215A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 20, 1996 |
| Grant date | Jun 9, 1998 |
| Priority date | — |
| Expiry date | Feb 20, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/04842
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for enhanced locator hit testing and region clipping of windows in a windowing environment of a data processing system is provided. A global hit test data structure is generated having a plurality of compressed scan line data sets that represent scan lines of a display. Each compressed scan line data set contains one or more vectors and a window identifier associated with each vector that describe the window ownership of one or more spans in an associated scan line of the display. A vector identifies a span of the associated scan line, and each window identifier identifies the window that owns the span identified by its associated vector. The enhanced locator hit testing of windows identifies the window that owns a selected pel of the display by accessing the compressed scan line data set that defines the window ownership of the selected pel, determining the vector that contains the selected pel, and retrieving the window identifier associated with the determined vector. The retrieved window identifier is the result of the enhanced locator hit test for the selected pel. The enhanced region clipping of windows performs region clipping by generating a bitmap image…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.