Metallic access test extender
US5764727A · kind A · utility
8Cited by
7References
50Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 23, 1996 |
| Grant date | Jun 9, 1998 |
| Priority date | — |
| Expiry date | May 23, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L1/24
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A metallic access test extender includes an office unit and a remote unit coupled to the office unit via a digital transmission system. A voltage controlled current source is included in the office unit and a voltage controlled voltage source in the remote unit. The voltage controlled current source is responsive to the voltage and current sensed at the remote unit load, and the voltage controlled voltage source is responsive to the voltage and current sensed at the input to the office unit. A shunt admittance which has a high impedance at DC and low frequencies is coupled to the office unit load.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.