Imaging system utilizing both diffuse and specular reflection characteristics
US5764874A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 8, 1996 |
| Grant date | Jun 9, 1998 |
| Priority date | — |
| Expiry date | Oct 8, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K13/0812
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An imaging system incorporating an illumination device, for illuminating an object to be observed with a continuous diffuse wide angle light source which is supplied along an observation axis of the imaging system, and an observation device is position along the observation axis for observing a reflection of the object to be observed. The illumination device and the observation device are both spaced a sufficient distance from the object to be observed so that the reflection of specular areas of the object can be perceived at an intensity which is substantially equal to the intensity of the continuous diffuse light supplied along the observation axis while the reflection of diffuse areas of the object can be perceived at an intensity substantially less than the intensity of the continuous diffuse light supplied along the observation axis, due to scattering of the supplied continuous diffuse light by diffuse areas upon reflection, so that the observation device can readily determine, due to the differences in the reflected intensities of the supplied light, at least one of the shape, the orientation, the boundary, the boarder, etc. between such areas and utilize that information for…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.