Method for reduction of selected ion intensities in confined ion beams
US5767512A · kind A · utility
32Cited by
6References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 5, 1996 |
| Grant date | Jun 16, 1998 |
| Priority date | — |
| Expiry date | Jan 5, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/145
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the method has the step of addition of a charge transfer gas to the carrier analyte combination that accepts charge from the carrier gas ions yet minimally accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the method as employed in various analytical instruments including an inductively coupled plasma mass spectrometer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.