Method and device for identifying designated materials in the composition of an object
US5768334A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 12, 1996 |
| Grant date | Jun 16, 1998 |
| Priority date | — |
| Expiry date | Jul 12, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/083
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The method comprises the following stages: first the attenuation function of at least three reference materials are determined across a wide x-ray spectrum and projection functions (F.sub.p1, F.sub.p2, F.sub.p3, F.sub.p4) forming a base are derived therefrom, then the attenuation function in said x-ray spectrum of at least one target material is determined and the attenuation function of each target material is projected onto said base; further, for each point of the object (1), the attenuation function of the object (1) is determined in said x-ray spectrum and projected onto said base, and the projections so obtained are compared with the projection from each target material and from this comparison an inference is made whether at least one target material enters the constitution of the object (1) at the point of inspection. Application: luggage inspection and control.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.