Patent · US Expired

X-ray examination apparatus with x-ray filter

US5768340A · kind A · utility

18Cited by

4References

20Claims

0Family size

Assignee

U.S. Philips Corporation · US

Inventors

Peter E. E. Geittner · Aachen, DE
Petrus W. J. Linders · Eindhoven, NL
Hans Lydtin · Stolberg, DE

Key dates

Filing date	Feb 13, 1997
Grant date	Jun 16, 1998
Priority date	—
Expiry date	Feb 13, 2017

Classification

Technology area (CPC G)Physics
CPC primaryG21K1/10
WIPO fieldEngines, pumps, turbines
WIPO sectorMechanical engineering

Abstract

An X-ray examination apparatus includes an X-ray filter with a plurality of filter elements for locally attenuating the X-ray beam. The X-ray absorptivity of each filter element is controlled by the amount of X-ray absorbing liquid with which the filter element is filled. The filling of filter elements is controlled by a voltage. The X-ray absorbing liquid contains a suspension of very small X-ray absorbing particles.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.