Patent · US Expired

Process and device for transient measuring of surface temperatures and heat flux

US5772329A · kind A · utility

22Cited by
10References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 22, 1996
Grant dateJun 30, 1998
Priority date—
Expiry dateAug 22, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01K17/20
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Process and apparatus for transiently measuring surface temperatures and heat flux at the interface of two media, one of which is solid. In a solid wall through which a thermal stream flows, a cut is made which opens into the interface between the wall and the other medium. The cut is parallel to the stream at a point of contact corresponding to the interface. A microthermocouple is arranged in a plane of the cut in the immediate vicinity of the interface. The cut is closely covered by the material of the solid wall or a material with thermal characteristics similar to those of the peripheral material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.