Apparatus for analysis of mixed gas components
US5777205A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 26, 1996 |
| Grant date | Jul 7, 1998 |
| Priority date | — |
| Expiry date | Sep 26, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/38
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The present invention provides an apparatus for the analysis of mixed gas components which can perform, in high precision, determination of the quantities of components contained in a sample gas containing a plurality of the components having molecular weights close to each other and which has a Fourier transform mass spectrometric means for ionizing a sample gas, applying a high frequency electric field to the ionized gas to induce cyclotron resonance, detecting the cyclotron resonance as a high-frequency decaying electric signal, and converting the resulting high-frequency decaying electric signal to a frequency-domain signal and a wavelength variable light irradiating means for irradiating a light of a single wavelength to ionize the molecules of the components constituting the sample gas, said irradiating means being able to vary the wavelength and/or intensity of the irradiation light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.