Patent · US Expired

Semiconductor device having improved alignment marks

US5777392A · kind A · utility

31Cited by
4References
8Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 28, 1996
Grant dateJul 7, 1998
Priority date
Expiry dateMar 28, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In a semiconductor device including a plurality of chip areas arranged in a matrix and a grid-like scribe areas a plurality of L-shaped alignment segments and a plurality of pairs of I-shaped alignment segments are provided within the scribe area. Each of the L-shaped alignment segments is located within a first quadrant defined by an X direction center line and a Y direction center line of the scirbe area, and each pair of the I-shaped alignment segments is located within a second quadrant defined by the X direction center line and the Y direction center line adjacent to the first quadrant.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.