Pattern recognition system and method
US5778342A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 1, 1996 |
| Grant date | Jul 7, 1998 |
| Priority date | — |
| Expiry date | Feb 1, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG10L21/0216
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A pattern recognition system and method is disclosed. The method includes the steps of a) providing a noisy test feature set of the input signal, a plurality of reference feature sets of reference templates produced in a quiet environment, and a background noise feature set of background noise present in the input signal, b) producing adapted reference templates from the test feature set, the background noise feature set and the reference feature sets and c) determining match scores defining the match between each of the adapted reference templates and the test feature set. The method can also include adapting the scores before accepting a score as the result. The system and method are described for both Hidden Markov Model (HMM) and Dynamic Time Warping (DTW) scoring units. The system performs the steps of the method.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.