Patent · US Expired

Coordinate measuring apparatus having a device for profile measurements and method for making said profile measurements

US5778551A · kind A · utility

17Cited by

10References

15Claims

0Family size

Assignee

Carl Zeiss Stiftung · DE

Inventors

Henrik Herklotz · Berlin, DE
Thomas Arndt · Bad König, DE
Rainer Ohnheiser · Heubach, DE
Karl Schepperle · Oberkochen, DE

Key dates

Filing date	Mar 11, 1996
Grant date	Jul 14, 1998
Priority date	—
Expiry date	Mar 11, 2016

Classification

Technology area (CPC G)Physics
CPC primaryG01B7/34
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

For roughness measurements, a passive roughness probe 118 having a probe tip 119 is exchanged into the measuring probe head of the coordinate measuring apparatus in lieu of the probe pin having a probe ball which is otherwise used to make coordinate measurements. The generation of the measurement points takes place while using the already available measured value transducers 23 in the probe head of the coordinate measuring apparatus. The desired surface characteristic variables are computed from the stored quasi-analog measured point sequence with the aid of a corresponding software module.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.