Heterodyne interferometer arrangement with tunable lasers, a heterodyne interferometer, a comparison interferometer and a reference interferometer
US5784161A · kind A · utility
28Cited by
3References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 20, 1996 |
| Grant date | Jul 21, 1998 |
| Priority date | — |
| Expiry date | Jun 20, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2290/70
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is directed to a heterodyne interferometer arrangement with tunable laser light sources for absolute distance measurement. The phase angle changes which occur in the synthetic interference signals when varying the laser frequencies are recorded and evaluated. The arrangement also enables error-free distance measurement in the event of a change in the mathematical sign of the phase changes due to frequency jitter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.