Patent · US Expired

Heterodyne interferometer arrangement with tunable lasers, a heterodyne interferometer, a comparison interferometer and a reference interferometer

US5784161A · kind A · utility

28Cited by
3References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 20, 1996
Grant dateJul 21, 1998
Priority date
Expiry dateJun 20, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B2290/70
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention is directed to a heterodyne interferometer arrangement with tunable laser light sources for absolute distance measurement. The phase angle changes which occur in the synthetic interference signals when varying the laser frequencies are recorded and evaluated. The arrangement also enables error-free distance measurement in the event of a change in the mathematical sign of the phase changes due to frequency jitter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.