Patent · US Expired

Method for measuring electronic devices under test with a network analyzer

US5784299A · kind A · utility

29Cited by
9References
12Claims
0Family size

Assignees

Inventors

Key dates

Filing dateJan 28, 1997
Grant dateJul 21, 1998
Priority date
Expiry dateJan 28, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R27/28
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

For measuring electronic devices under test with a network analyzer, the electronic devices to be embedded into a linear auxiliary network during their operation, as well as, during the measurement. First, system error correction data is determined for the network analyzer according to a known calibration method by connecting calibration standards. Then, the characteristic data for the auxiliary network to be used is determined and is linked with the system error correction data to form new error correction simulation data. Finally, in the subsequent measurement of devices under test connected to the network analyzer, this error correction simulation data is appropriately considered with the algorithm for system error correction that is present in the network analyzer, so that an auxiliary network virtually connected to the device under test is simulated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.