Flaw detection apparatus employing tire probes having ultrasonic oscillators mounted therein
US5786535A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 15, 1996 |
| Grant date | Jul 28, 1998 |
| Priority date | — |
| Expiry date | Nov 15, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/102
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for detecting flaws using supersonic waves measures a thickness of a test object or a position of a cavity inside the test object by employing a pair of ultrasonic probes. By, changing a relative position of one ultrasonic probe to that of the other ultrasonic probe, a plurality of waveform data of ultrasonic reception signals is acquired. Each of the acquired waveform data is added together. Because a surface wave component of each waveform data has a shifted phase due to a difference in arrival times, a level of the surface wave component is offset and thus minimized through addition of the waveform data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.