Metallic tray unit for testing a semiconductor device
US5786704A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Mar 13, 1996 |
| Grant date | Jul 28, 1998 |
| Priority date | — |
| Expiry date | Mar 13, 2016 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S269/903
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A metallic tray unit for testing a semiconductor device is disclosed including: a unit body on the bottom having a cavity in which a semiconductor device for testing is placed; and fixing equipment for holding the semiconductor device in the cavity when the semiconductor device is moved to the lower part of the unit body. The unit body has rectangular openings, one of which is opened in the direction of the upper part of the cavity and another which is opened toward the cavity. The fixing equipment includes plate springs that are installed on side walls of the openings in parallel thereto. The plate springs are opened as the device is inserted into the cavity, and then are returned to their former condition after insertion of the device thereto, whereby their ends exposed to the cavity catch the device. In addition, each of the plate springs includes on the end exposed to the cavity a catching lug for holding both ends of the device; and a guiding lug formed faced to the catching lug to lead the movement of the plate spring.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.