Focal plane array calibration method
US5789622A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 12, 1996 |
| Grant date | Aug 4, 1998 |
| Priority date | — |
| Expiry date | Sep 12, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/48
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of calibrating gains and offsets for a two-dimensional detector array 10 comprising individual detector elements 14, including: (a) focusing a first incoming image signal at a first power level onto the detector array 10; (b) reading the corresponding electrical signals from the detector elements 14 as a first image frame at the first power level; (c) for each detector element 14, translating the first incoming image signal by a detector element distance onto an adjacent detector element; (d) reading the corresponding electrical signal from the detector elements 14 as a second image frame at the first power level; (e) focusing a second incoming image signal at a second power level onto the detector array 10; (f) reading the corresponding electrical signals from the detector elements 14 as a first image frame at the second power level; (g) for each detector element 14, translating the second incoming image signal by a detector element distance onto an adjacent detector element; (h) reading the corresponding electrical signals from the detector elements 14 as a second image frame at the second power level; (i) selecting a reference detector element 18; (j) determining the ga…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.