Patent · US Expired

Apparatus for measuring particle properties

US5793478A · kind A · utility

19Cited by
8References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 19, 1996
Grant dateAug 11, 1998
Priority date
Expiry dateNov 19, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01P5/20
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus for determining particle properties from detected light scattered by the particles. The apparatus uses a light beam with novel intensity characteristics to discriminate between particles that pass through the beam and those that pass through an edge of the beam. The apparatus can also discriminate between light scattered by one particle and light scattered by multiple particles. The particle's size can be determined from the intensity of the light scattered. The particle's velocity can be determined from the elapsed time between various intensities of the light scattered.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.