Die-level burn-in and test flipping tray
US5794783A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Dec 31, 1996 |
| Grant date | Aug 18, 1998 |
| Priority date | — |
| Expiry date | Dec 31, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2221/68313
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A die-level test and burn-in flipping tray. A tray having a plurality of pockets adapted to receive die-level carriers formed thereon is provided. The pockets are defined by four risers, one riser defining each corner of the pocket and a support at the base of each riser to support a die-level carrier disposed within the pocket. The riser and the tray are molded such that a second tray may be mated with the original tray, the second tray having pockets in one-to-one correspondence with the first tray. The mated tray pair may then be inverted causing carriers in pockets of the first tray to transition under the influence of gravity to corresponding pockets of the second tray in an orientation inverted about the z-axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.