Method and apparatus for the cross-sectional measurement of electric insulated conductors
US5795531A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 26, 1995 |
| Grant date | Aug 18, 1998 |
| Priority date | — |
| Expiry date | Sep 26, 2015 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB29C2948/92952
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method and an apparatus for an exact measurement of the thickness of a plurality of individual semi-conductor and insulation layers and the determination of the centricity/eccentricity of a medium-voltage and/or high-voltage insulated conductor. The individual semi-conductor and insulation layers of the insulated conductor emerging from an extrusion device are penetrated with X-rays in at least two directions laying within a plane orthogonal to the axis of the insulated conductor. On carrying out a line-scan intensity detection of the X-rays having penetrated the insulated conductor, the thickness of the individual layers as well as the position of the conductor is computed. These values are compared with target ones, and, if necessary, the position of the extruder heads can be corrected accordingly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.