Patent · US Expired

High-precision voltage dependent timing delay circuit

US5796284A · kind A · utility

15Cited by
5References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 16, 1996
Grant dateAug 18, 1998
Priority date
Expiry dateDec 16, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K19/00323
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

For high-speed single-ended sensing of the small signal delivered from a (static) RAM or ROM cell, a voltage dependent timing delay circuit is disclosed which prevents early triggering of the set signal of the sense amplifier (SSA 66) when applying a high voltage screen test (i.e. 1.5 times V.sub.DD) to the cell. The timing of the SSA signal is achieved by a high precision delay chain comprising inverters, which is loaded by a voltage dependent current sink (70) coupled to the output of the chain. The inverter delay chain controls the input (SE0) for a driver for the SSA line (66). The current sink may be a pull down NFET (70) which is only activated when the supply voltage is above a determined switching threshold therefor. The gate voltage of the NFET is controlled by a bias control circuit (72) in such a manner that during operation at typical voltage levels, the NFET is deactivated, whereas at higher operating voltage levels (such as 1.5 * V.sub.DD) the NFET is turned on, thereby sinking current from the input (SE0) to the driver for the SSA line. The SSA signal is consequently delayed preventing the early triggering thereof.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.