Generation and use of defective images in image analysis
US5796410A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 12, 1990 |
| Grant date | Aug 18, 1998 |
| Priority date | — |
| Expiry date | Jun 12, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/774
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Apparatus and methods for generating a set of defective images from a model image. Defect parameters used with the apparatus and methods specify classes of defects including resolution, blur, threshold, speckle, jitter, skew, distortion of width and height, offset from a baseline, and kerning. The parameters further permit specification of a range of sizes of the defects and a distribution of the defects within the range. Within the apparatus, actual values for the defects are generated randomly within the specified ranges and distributions. The model image may be represented by means of pixels or by a format which describes the model image's shape. The user may specify the number and the size of the defective images. The defective images are useful for inferring accurate and efficient image classifiers for use in image recognition devices such as optical character readers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.