Patent · US Expired

Method and device for the measurement of off-center rotating components

US5796485A · kind A · utility

11Cited by

2References

8Claims

0Family size

Assignee

Steinheil Industrielle Messtechnik GMBH · DE

Inventors

Hans-Ulrich Dassler · Oberschleißheim, DE
Rudiger Haas · Altenkirchen, DE
Johann LANG · Schierling, DE

Key dates

Filing date	Jul 17, 1996
Grant date	Aug 18, 1998
Priority date	—
Expiry date	Jul 17, 2016

Classification

Technology area (CPC G)Physics
CPC primaryG01B11/08
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An apparatus and a method are presented in order to carry out an automatic optical inspection of an off-center rotating component to be measured. Using a measurement procedure which avoids mechanical contact having a source producing parallel rays and a detecting means, the off-center rotating component is rotated about a rotational axis, whereby a motion of the detecting means is synchronized with the rotation and is carried out in such a fashion that the separation, in the direction of an optical axis, between the off-center rotating component and the detecting means remains constant. In this manner optical distortions are avoided which would otherwise occur in the optical measurement procedure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.