Patent · US Expired

Measurement apparatus and method for the adjustment of test/measurement parameters

US5801953A · kind A · utility

24Cited by

12References

24Claims

0Family size

Assignee

Hewlett-Packard Company, L.P. · US

Inventors

Peter Thoma · Mannheim, DE
Alf Clement · Aidlingen, DE
Juergen Sang · Gechingen, DE
Peter Hoffmann · Korschenbroich, DE
Robert Jahn · Greer, US

Key dates

Filing date	Oct 4, 1996
Grant date	Sep 1, 1998
Priority date	—
Expiry date	Oct 4, 2016

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/025
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An instrument is described for the measurement of optical and/or electrical signals, such as an optical time domain reflectometer (OTDR) or an electrical time domain reflectometer (TDR). The instrument includes a display to depict a waveform representative of measured signals, and can be operated by a few buttons, namely a start/stop button, a cursor-key and a select/confirmation-key. After adjustment of display parameters, almost the entire display is available for display of measured signals and data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.