Patent · US Expired

Integrated circuit having an embedded digital signal processor and externally testable signal paths

US5802270A · kind A · utility

25Cited by
20References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 14, 1997
Grant dateSep 1, 1998
Priority date
Expiry dateMar 14, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F15/7867
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An integrated circuit chip comprises a digital signal processor core (12) formed on a portion of the surface area of the chip (10). The digital signal processor (12) has a read only memory (14), a random access memory (16), a register file (18), an arithmetic logic unit (20) and a multiplier circuit (22). The remaining surface area of the integrated circuit chip (10) forms a user-definable circuitry area (24) which is used to form added circuitry to interface the digital signal processor (12) with other components of an integrated data processing system. The circuits formed in the user-definable circuitry area (24) are coupled to other integrated circuit chips through universal input/output bond pads (28). In one embodiment of the present invention, parallel module testing multiplexers (26) are added to aid in the testing of the digital signal processor (12) and the added circuits formed in the user-definable circuitry area (24).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.