Reflective test patches for translucent color filters in photosensitive semiconductor chips
US5808297A · kind A · utility
14Cited by
9References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 22, 1996 |
| Grant date | Sep 15, 1998 |
| Priority date | — |
| Expiry date | Jul 22, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F39/8053
Abstract
Semiconductor chips for use in a chip array assembly for scanning of hard-copy images include rows of photosensors, each row of photosensors having a polyimide filter layer for passing one primary color. In addition to the photosensors, a reflective area is provided on the chip, with filter portions provided on the reflective area. The filter portions are created at the same time as the filter layers placed on the photosensors. The filter layers disposed on the reflective area can be used as test sites for determining the light transmissivity of the filter layers on the photosensors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.