Infrared screening and inspection system
US5808303A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 29, 1997 |
| Grant date | Sep 15, 1998 |
| Priority date | — |
| Expiry date | Jan 29, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/309
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In general, the spatial resolution and repeatability of results using infrared detectors for examining printed circuit cards has been so poor that the devices have failed to achieve commercial success. These problems are overcome by a system including an isothermal enclosure for receiving a card to be tested, an infrared camera in the chamber defined by the enclosure, sensors for monitoring the temperature of the card and ambient temperature conditions in the chamber to derive signals indicative of the temperatures, and a computer connected to the camera and to the sensors for examining all signals to produce a three dimensional image of the sample, variations in the image from sample to sample being indicative of an anomaly in a sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.