Patent · US Expired

Interconnect structure and method of forming

US5808362A · kind A · utility

3Cited by
9References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 29, 1996
Grant dateSep 15, 1998
Priority date
Expiry dateFeb 29, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/0217

Abstract

A graded-channel semiconductor device (10) is formed in a pedestal (12). The pedestal (12) is formed on a substrate (11) and improves the electrical characteristics of the device (10) compared to conventional device structures. The pedestal (12) has sides (13) that are bordered by a first dielectric layer (24) to provide electrical isolation. An interconnect structure (90) can be optionally formed in conjunction with the formation of the device (10). The interconnect structure (90) has a plurality of conductors (60,97) that can be used to transport electrical signals across the device (10).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.