Electric signal measurement apparatus using electro-optic sampling by one point contact
US5808473A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 3, 1995 |
| Grant date | Sep 15, 1998 |
| Priority date | — |
| Expiry date | Aug 3, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/311
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electric signal measurement apparatus using the electro-optic sampling which is capable of measuring electric signals propagating on a signal line with only a lower disturbance, in a high precision over a wide bandwidth, and economically by a relatively compact apparatus size. The apparatus has a conductor body to be set in one point contact with the signal line, and an electro-optic material which changes a birefringence according to a strength of an electric field coupled by the conductor body, and which has a sufficient thickness between the lower surface and an upper surface such that a potential at the upper surface due to the electric field coupled by the conductor body is effectively zero. A polarization detector for detecting the laser beam with a polarization changed due to a change of the birefringence of the electro-optic material can be provided within a handy type probe body to which a probe head is attached.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.