Patent · US Expired

Diagnostic system

US5808919A · kind A · utility

43Cited by
14References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 31, 1995
Grant dateSep 15, 1998
Priority date
Expiry dateOct 31, 2015

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31912
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A diagnostic system (10) for diagnosing the cause of failures of functional tests made on a system under test wherein the system under test comprises a plurality of interacting components and wherein the diagnostic system (10) comprises means (20) for interpreting test results based on the set of operations which are involved in carrying out the tests and which components are exercised by operations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.