Method of extracting contours using multifractal analysis
US5809169A · kind A · utility
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Key dates
| Filing date | Mar 15, 1996 |
| Grant date | Sep 15, 1998 |
| Priority date | — |
| Expiry date | Mar 15, 2016 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30181
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of extracting a contour of a contrasted area in a digitized image made up of pixels having different intensity levels defining the contrasted area is based on minimizing the energy of an initial active contour to which are applied stresses derived from a potential image obtained by processing the image. The potential image is obtained from a multifractal analysis of the image so that each element of the potential image is representative of a local fractal dimension in the locality of a corresponding pixel in the image. This improves the behavior of the active contour when it is deformed by the stresses.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.