Patent · US Expired

Method and apparatus for calibrating integrated circuits

US5812013A · kind A · utility

2Cited by
2References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 21, 1996
Grant dateSep 22, 1998
Priority date
Expiry dateAug 21, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C17/18
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and an apparatus for calibrating an integrated circuit by blowing a fusible link. A blowing current is caused to flow through the fusible link via a switch element. When the fusible link blows to render it nonconductive, a sudden voltage pulse appears which is detected by a differentiating element and utilized to quickly turn off the switch element and, thereby, avoid damage to the integrated circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.