Patent · US Expired

Method for producing a bipolar semiconductor device having SiC-based epitaxial layer

US5814546A · kind A · utility

11Cited by
4References
18Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 1, 1996
Grant dateSep 29, 1998
Priority date
Expiry dateNov 1, 2016

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/931
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for producing a bipolar semiconductor device having a first layer doped according to a first doping type, the first layer being adapted to have minority charge carriers injected thereinto from a second layer of the device of a doping type opposite to that of the first layer in a forward conducting state of the device, comprises the steps of a) epitaxially growing the first layer and b) providing at least one region of the first layer with the minority charge carriers having a lifetime lower than in other parts of the first layer, the lower lifetime region of the first layer being formed directly during the epitaxial growth of this region by changing composition of substances fed to the first layer for the growth thereof when the region is grown.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.